Knowledge Sharing

Electroluminescence (EL) is an electrical and optical phenomenon in which a material emits light in response to a passage of an electric current or to a strong electric field. Onsite EL Imaging is performed after evening twilight so that IR from the Sun does not affect IR luminescence from the module. This technology is used to test the solar modules for inherent defects like micro-crack, soldering defects, debris or even to detect an inactive string inside a solar module. EL Imaging is becoming more and more important for quality testing

Indian solar industry has grown tremendously over the last decade, a trend that is expected to continue in the coming years. India has become one of the cheapest producers of solar power worldwide. While this cost reduction was driven mainly by the falling module prices, increased competition and aggressive bidding had led many developers to cut down on their O&M budget. Lower O&M budgets can downgrade the sophistication of O&M practices. Here’s a list of 10 items that lean O&M teams should avoid ensuring best-in-class O&M with a limited budget.

Bifacial modules are those which produces solar power from both sides of the panel in contrast to the conventional mono-facial modules, which produces power from only one side where solar radiation is received.  In the case of Bi-facial, power is produced from both the sides of the panel using direct radiation falling on the module as well as indirect radiation coming through reflection from ground or diffusion. Fig 1 [1] below illustrates the working of the bi-facial module:

The power generation from the rear side highly depends upon the reflectivity of

In the earlier editions of this newsletter, we discussed the mechanism of potential induced degradation in poly-crystalline and thin-film modules and how it is impacting the performance of the existing solar power plants. In the current article, we will talk about the different component in cells and modules that could impact the PID susceptibility of solar modules in the plant. We will also discuss how we can test for PID susceptibility and what does “PID free” tag actually mean

Certain types of cells or modules may be more susceptible to PID

In continuation of our previous article on “Introduction to Potential Induced Degradation”, we have compiled research and data, to help our readers understand this mechanism in thin-film modules. In this article, we will also talk about some common performance issues faced by plants with thin film modules and the corrective measures that can be taken to improve performance from these plants.

Thin-film modules hit the solar PV market in India as the second generation of PV modules in 2010. Between the years 2011-2014, the total installed capacity of thin-film modules

Potential-induced degradation (PID) has received considerable attention in recent years due to its detrimental impact on photovoltaic (PV) module performance under field conditions. Both crystalline silicon (c-Si) and thin-film PV modules are susceptible to PID and PID drastically impact the reliability of the c-Si and thin film modules.

PV Diagnostics will release a series of articles to talk about PID mechanism in both, c-Si and thin-film PV modules, modelling of leakage current paths in the module package, dependence of temperature, humidity and voltage on the spreading PID and preventive measures for

Solar PV installations have been growing at an unprecedented rate in India, with the cumulative capacity already being more than 20GW. However, this rapid scaling, coupled with ever falling tariffs and intense competition may be resulting in compromised quality. And therefore, while we may have installed the capacity, we may not be generating as much green power as we would have expected.

Over a period of 1 year, we studied more than 500MWp of plants across the country to identify the degradation patterns in plants and kinds of defects observed. Data